Issued Patents 2018
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10127651 | Defect sensitivity of semiconductor wafer inspectors using design data with wafer image data | Saibal Banerjee, Santosh Bhattacharyya, Bjorn Brauer | 2018-11-13 |
| 10074167 | Reducing registration and design vicinity induced noise for intra-die inspection | Saibal Banerjee, Shaoyu Lu | 2018-09-11 |
| 10043261 | Generating simulated output for a specimen | Kris Bhaskar, Jing Zhang, Grace Hsiu-Ling Chen, Laurent Karsenti | 2018-08-07 |
| 9965848 | Shape based grouping | Saibal Banerjee, Jagdish Chandra Saraswatula, Santosh Bhattacharyya | 2018-05-08 |