| 10164480 |
Composite integrated circuits and methods for wireless interactions therewith |
Min-Jer Wang, Ching-Nen Peng, Chewn-Pu Jou, Feng-Wei Kuo, Hung-Chih Lin +4 more |
2018-12-25 |
| 10124111 |
Small molecule dye for molecular imaging and photothermal therapy |
Zhen Cheng, Xuechuan HONG, Hongjie Dai, Alexander L. Antaris, Kai Cheng |
2018-11-13 |
| 10073135 |
Alignment testing for tiered semiconductor structure |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Mincent Lee |
2018-09-11 |
| 10067181 |
Testing holders for chip unit and die package |
Mill-Jer Wang, Kuo-Chuan Liu, Ching-Nen Peng, Hung-Chih Lin |
2018-09-04 |
| 10002829 |
Semiconductor device and manufacturing method thereof |
Chen-Hsiang Hsu, Hung-Chih Lin, Ching-Nen Peng, Mill-Jer Wang |
2018-06-19 |
| 9960274 |
FinFET device for device characterization |
Chang-Yun Chang, Cheng-Chuan Huang, Fu-Liang Yang |
2018-05-01 |
| 9952279 |
Apparatus for three dimensional integrated circuit testing |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Chung-Han Huang, Chung-Sheng Yuan +3 more |
2018-04-24 |
| 9915699 |
Integrated fan-out pillar probe system |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Mincent Lee, Chen-Hung Tien +1 more |
2018-03-13 |
| 9900970 |
Three dimensional integrated circuit electrostatic discharge protection and prevention test interface |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin |
2018-02-20 |
| 9891266 |
Test circuit and method |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Sen-Kuei Hsu, Chuan-Ching Wang |
2018-02-13 |
| 9880201 |
Systems for probing semiconductor wafers |
Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin |
2018-01-30 |
| 9859176 |
Semiconductor device, test system and method of the same |
Tang-Jung Chiu, Mill-Jer Wang, Hung-Chih Lin |
2018-01-02 |
