Issued Patents 2018
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10073135 | Alignment testing for tiered semiconductor structure | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen | 2018-09-11 |
| 9915699 | Integrated fan-out pillar probe system | Mill-Jer Wang, Ching-Nen Peng, Hung-Chih Lin, Hao Chen, Chen-Hung Tien +1 more | 2018-03-13 |