| 10127649 |
Electron channeling pattern acquisition from small crystalline areas |
Stephen W. Bedell, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser |
2018-11-13 |
| 10109737 |
Method of forming high-germanium content silicon germanium alloy fins on insulator |
Pouya Hashemi, Renee T. Mo, Alexander Reznicek |
2018-10-23 |
| 9984941 |
Non-destructive, wafer scale method to evaluate defect density in heterogeneous epitaxial layers |
Stephen W. Bedell |
2018-05-29 |
| 9972688 |
Post growth defect reduction for heteroepitaxial materials |
Devendra K. Sadana, Brent A. Wacaser |
2018-05-15 |
| 9947533 |
Selective epitaxy using epitaxy-prevention layers |
Cheng-Wei Cheng, Jeehwan Kim, Devendra K. Sadana |
2018-04-17 |
| 9917220 |
Buffer layer for high performing and low light degraded solar cells |
Augustin J. Hong, Marinus Hopstaken, Jeehwan Kim, Devendra K. Sadana |
2018-03-13 |
| 9865737 |
Formation of FinFET junction |
Kevin K. Chan, Pouya Hashemi, Ali Khakifirooz, Alexander Reznicek |
2018-01-09 |
| 9859091 |
Automatic alignment for high throughput electron channeling contrast imaging |
Stephen W. Bedell, Kunal Mukherjee, Devendra K. Sadana, Brent A. Wacaser |
2018-01-02 |
| 9859367 |
Stacked strained and strain-relaxed hexagonal nanowires |
Takashi Ando, Pouya Hashemi, Alexander Reznicek |
2018-01-02 |
