| 9773807 |
Conductive components and memory assemblies |
Sudip Bandyopadhyay, Keen Wah Chow, Devesh Kumar Datta, David Ross Economy, John Mark Meldrim |
2017-09-26 |
| 9766289 |
LBIST debug controller |
Mayank Parasrampuria, Sagar Kataria |
2017-09-19 |
| 9754825 |
Conductive interconnect structures incorporating negative thermal expansion materials and associated systems, devices, and methods |
Hongqi Li, Jin Lu, Shyam Ramalingam |
2017-09-05 |
| 9627295 |
Devices, systems and methods for manufacturing through-substrate vias and front-side structures |
Jian He, Lalapet Rangan Vasudevan, Kyle K. Kirby, Hongqi Li |
2017-04-18 |
| 9599673 |
Structural testing of integrated circuits |
Nipun Mahajan |
2017-03-21 |
| 9599672 |
Integrated circuit with scan chain having dual-edge triggered scannable flip flops and method of operating thereof |
Kumar Abhishek, Nishant Madan, Mayank Tutwani |
2017-03-21 |
| 9568551 |
Scan wrapper circuit for integrated circuit |
Sagar Kataria, Abhishek Mahajan, Mayank Parasrampuria |
2017-02-14 |
