Issued Patents 2017
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9778316 | Multi-stage test response compactors | Janusz Rajski, Jerzy Tyszer, Grzegorz Mrugalski, Wu-Tung Cheng | 2017-10-03 |
| 9720040 | Timing-aware test generation and fault simulation | Xijiang Lin, Kun-Han Tsai, Chen Wang, Janusz Rajski | 2017-08-01 |
| 9664739 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rasjki, Jerzy Tyszer, Nilanjan Mukherjee | 2017-05-30 |
| 9651622 | Isometric test compression with low toggling activity | Janusz Rajski, Amit Amar Kumar, Elham K. Moghaddam, Nilanjan Mukherjee, Jerzy Tyszer +1 more | 2017-05-16 |