Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9720038 | Method and circuit of pulse-vanishing test | Shi-Yu Huang, Wu-Tung Cheng, Jeo-Yen Lee | 2017-08-01 |
| 9720040 | Timing-aware test generation and fault simulation | Xijiang Lin, Mark Kassab, Chen Wang, Janusz Rajski | 2017-08-01 |