Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9778316 | Multi-stage test response compactors | Janusz Rajski, Jerzy Tyszer, Mark Kassab, Wu-Tung Cheng | 2017-10-03 |
| 9714981 | Test-per-clock based on dynamically-partitioned reconfigurable scan chains | Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer | 2017-07-25 |