Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9778316 | Multi-stage test response compactors | Janusz Rajski, Grzegorz Mrugalski, Mark Kassab, Wu-Tung Cheng | 2017-10-03 |
| 9720041 | Scan-based test architecture for interconnects in stacked designs | Janusz Rajski | 2017-08-01 |
| 9714981 | Test-per-clock based on dynamically-partitioned reconfigurable scan chains | Janusz Rajski, Jedrzej Solecki, Grzegorz Mrugalski | 2017-07-25 |
| 9664739 | Continuous application and decompression of test patterns and selective compaction of test responses | Janusz Rasjki, Mark Kassab, Nilanjan Mukherjee | 2017-05-30 |
| 9651622 | Isometric test compression with low toggling activity | Janusz Rajski, Amit Amar Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee +1 more | 2017-05-16 |