Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9659757 | Measuring and controlling wafer potential in pulsed RF bias processing | Andras Kuthi, Stephen Hwang, James C. Vetter, Greg Eilenstine, Rongping Wang | 2017-05-23 |
TN
Tuan Ngo
Overall (2017): #208,526 of 506,227Top 45%
1
Patents 2017