Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9659757 | Measuring and controlling wafer potential in pulsed RF bias processing | Andras Kuthi, Stephen Hwang, James C. Vetter, Rongping Wang, Tuan Ngo | 2017-05-23 |
GE
Greg Eilenstine
Overall (2017): #413,274 of 506,227Top 85%
1
Patents 2017