Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9659757 | Measuring and controlling wafer potential in pulsed RF bias processing | Andras Kuthi, James C. Vetter, Greg Eilenstine, Rongping Wang, Tuan Ngo | 2017-05-23 |
SH
Stephen Hwang
Overall (2017): #234,801 of 506,227Top 50%
1
Patents 2017