Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9607265 | Accurate and fast neural network training for library-based critical dimension (CD) metrology | Wen Jin, Vi Vuong, Junwei Bao, Leonid Poslavsky | 2017-03-28 |
| 9553033 | Semiconductor device models including re-usable sub-structures | Jonathan Iloreta, Matthew A. Laffin, Leonid Poslavsky, Torsten R. Kaack, Qiang Zhao | 2017-01-24 |