Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9625823 | Calculation method for local film stress measurements using local film thickness values | Leonid Poslavsky, Yu Tay | 2017-04-18 |
| 9553033 | Semiconductor device models including re-usable sub-structures | Jonathan Iloreta, Matthew A. Laffin, Leonid Poslavsky, Qiang Zhao, Lie-Quan Lee | 2017-01-24 |