Issued Patents 2017
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9607265 | Accurate and fast neural network training for library-based critical dimension (CD) metrology | Wen Jin, Junwei Bao, Lie-Quan Lee, Leonid Poslavsky | 2017-03-28 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9607265 | Accurate and fast neural network training for library-based critical dimension (CD) metrology | Wen Jin, Junwei Bao, Lie-Quan Lee, Leonid Poslavsky | 2017-03-28 |