Amir Widmann — 3 Patents at Kla-Tencor

Issued Patents 2017

Showing 1–3 of 3 patents

Patent #	Title	Co-Inventors	Date
9651943	Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers	Pavel Izikson, John Robinson, Mike Adel, DongSub Choi, Anat Marchelli	2017-05-16
9576861	Method and system for universal target based inspection and metrology	Allen Park, Ellis Chang, Michael Adel, Kris Bhaskar, Ady Levy +2 more	2017-02-21
9558978	Material handling with dedicated automated material handling system	Michael Adel, Pati Sekula	2017-01-31