Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9651943 | Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers | Pavel Izikson, John Robinson, Mike Adel, DongSub Choi, Anat Marchelli | 2017-05-16 |
| 9576861 | Method and system for universal target based inspection and metrology | Allen Park, Ellis Chang, Michael Adel, Kris Bhaskar, Ady Levy +2 more | 2017-02-21 |
| 9558978 | Material handling with dedicated automated material handling system | Michael Adel, Pati Sekula | 2017-01-31 |