Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9659670 | Computer-implemented methods, computer-readable media, and systems for classifying defects detected in a memory device area on a wafer | SunYong Choi, YeonHo Pae | 2017-05-23 |
| 9576861 | Method and system for universal target based inspection and metrology | Allen Park, Michael Adel, Kris Bhaskar, Ady Levy, Amir Widmann +2 more | 2017-02-21 |