Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9799486 | Charged particle beam apparatus for measuring surface potential of a sample | Seiichiro Kanno, Yasushi Ebizuka, Go Miya | 2017-10-24 |
| 9543053 | Electron beam equipment | Yasunari Sohda, Takeyoshi Ohashi, Hajime Kawano | 2017-01-10 |