Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9799486 | Charged particle beam apparatus for measuring surface potential of a sample | Seiichiro Kanno, Go Miya, Takafumi Miwa | 2017-10-24 |
| 9543113 | Charged-particle beam device for irradiating a charged particle beam on a sample | Seiichiro Kanno, Naoya Ishigaki, Masashi Fujita | 2017-01-10 |