PP

Pavel Potocek

FE Fei: 1 patents #38 of 122Top 35%
Overall (2017): #284,689 of 506,227Top 60%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9711325 Charged-particle microscope providing depth-resolved imagery Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Xiaodong Zhuge, Berend Helmerus Lich 2017-07-18