BL

Berend Helmerus Lich

FE Fei: 1 patents #38 of 122Top 35%
📍 Weert, NL: #12 of 27 inventorsTop 45%
Overall (2017): #479,921 of 506,227Top 95%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9711325 Charged-particle microscope providing depth-resolved imagery Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Pavel Potocek, Xiaodong Zhuge 2017-07-18