EB

Eric Gerardus Theodoor Bosch

FE Fei: 1 patents #38 of 122Top 35%
Overall (2017): #430,401 of 506,227Top 90%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9711325 Charged-particle microscope providing depth-resolved imagery Faysal Boughorbel, Pavel Potocek, Xiaodong Zhuge, Berend Helmerus Lich 2017-07-18