FB

Faysal Boughorbel

FE Fei: 2 patents #11 of 122Top 10%
Overall (2017): #154,382 of 506,227Top 35%
2
Patents 2017

Issued Patents 2017

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9711325 Charged-particle microscope providing depth-resolved imagery Eric Gerardus Theodoor Bosch, Pavel Potocek, Xiaodong Zhuge, Berend Helmerus Lich 2017-07-18
9620330 Mathematical image assembly in a scanning-type microscope Pavel Poto{hacek over (c)}ek, Cornelis Sander Kooijman, Hendrik Nicolaas Slingerland, Gerard Nicolaas Anne van Veen 2017-04-11