CK

Cornelis Sander Kooijman

FE Fei: 2 patents #11 of 122Top 10%
Overall (2017): #161,745 of 506,227Top 35%
2
Patents 2017

Issued Patents 2017

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
9812287 Charged particle microscope with improved spectroscopic functionality Thijs Thomas Withaar, Gerard Nicolaas Anne van Veen 2017-11-07
9620330 Mathematical image assembly in a scanning-type microscope Pavel Poto{hacek over (c)}ek, Hendrik Nicolaas Slingerland, Gerard Nicolaas Anne van Veen, Faysal Boughorbel 2017-04-11