TW

Thijs Thomas Withaar

FE Fei: 1 patents #38 of 122Top 35%
Overall (2017): #217,012 of 506,227Top 45%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9812287 Charged particle microscope with improved spectroscopic functionality Cornelis Sander Kooijman, Gerard Nicolaas Anne van Veen 2017-11-07