XZ

Xiaodong Zhuge

FE Fei: 1 patents #38 of 122Top 35%
📍 Tilburg, NL: #16 of 42 inventorsTop 40%
Overall (2017): #193,470 of 506,227Top 40%
1
Patents 2017

Issued Patents 2017

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9711325 Charged-particle microscope providing depth-resolved imagery Faysal Boughorbel, Eric Gerardus Theodoor Bosch, Pavel Potocek, Berend Helmerus Lich 2017-07-18