Issued Patents 2017
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9651943 | Methods and systems for creating or performing a dynamic sampling scheme for a process during which measurements are performed on wafers | Pavel Izikson, Mike Adel, Amir Widmann, DongSub Choi, Anat Marchelli | 2017-05-16 |
| 9620426 | Method and system for providing process tool correctables using an optimized sampling scheme with smart interpolation | Pavel Izikson, Daniel Kandel | 2017-04-11 |