Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9816939 | Virtual inspection systems with multiple modes | Saibal Banerjee | 2017-11-14 |
| 9601393 | Selecting one or more parameters for inspection of a wafer | Chris W. Lee, Lisheng Gao, Tao Luo, Kenong Wu, Tommaso Torelli +1 more | 2017-03-21 |