Issued Patents 2017
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9851397 | Electromigration testing of interconnect analogues having bottom-connected sensory pins | Fen Chen, Cathryn J. Christiansen, Prakash Periasamy, Michael A. Shinosky | 2017-12-26 |
| 9739824 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2017-08-22 |