Issued Patents 2017
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9791502 | On-chip usable life depletion meter and associated method | Jeanne P. Bickford, Baozhen Li, Tad J. Wilder | 2017-10-17 |
| 9739824 | Optimization of integrated circuit reliability | Carole D. Graas, Deborah M. Massey, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2017-08-22 |
| 9639645 | Integrated circuit chip reliability using reliability-optimized failure mechanism targeting | Jeanne P. Bickford, Baozhen Li, Tad J. Wilder | 2017-05-02 |
| 9625325 | System and method for identifying operating temperatures and modifying of integrated circuits | Jeanne P. Bickford, Baozhen Li, Tad J. Wilder | 2017-04-18 |
| 9618566 | Systems and methods to prevent incorporation of a used integrated circuit chip into a product | Jeanne P. Bickford, Baozhen Li, Tad J. Wilder | 2017-04-11 |
| 9594868 | Scaling voltages in relation to die location | Eric A. Foreman, Kerim Kalafala | 2017-03-14 |