| 9853179 |
Reducing dark current in germanium photodiodes by electrical over-stress |
Jason S. Orcutt |
2017-12-26 |
| 9831084 |
Hydroxyl group termination for nucleation of a dielectric metallic oxide |
Takashi Ando, Michael P. Chudzik, Min Dai, Martin M. Frank, David F. Hilscher +3 more |
2017-11-28 |
| 9791499 |
Circuit to detect previous use of computer chips using passive test wires |
Keith A. Jenkins, Kevin G. Stawiasz |
2017-10-17 |
| 9791500 |
Circuit to detect previous use of computer chips using passive test wires |
Keith A. Jenkins, Kevin G. Stawiasz |
2017-10-17 |
| 9755100 |
Reducing dark current in germanium photodiodes by electrical over-stress |
Jason S. Orcutt |
2017-09-05 |
| 9678141 |
Measurement for transistor output characteristics with and without self heating |
Keith A. Jenkins |
2017-06-13 |
| 9634116 |
Method to improve reliability of high-K metal gate stacks |
Takashi Ando, Eduard A. Cartier, Vijay Narayanan |
2017-04-25 |
| 9570569 |
Selective thickening of PFET dielectric |
Takashi Ando, Hemanth Jagannathan |
2017-02-14 |
