Issued Patents 2017
Showing 1–25 of 40 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9842927 | Integrated circuit structure without gate contact and method of forming same | Hui Zang, Manfred Eller, Jerome Ciavatti | 2017-12-12 |
| 9831346 | FinFETs with air-gap spacers and methods for forming the same | Hui Zang | 2017-11-28 |
| 9831248 | Embedded DRAM cells having capacitors within trench silicide trenches of a semiconductor structure | Hui Zang | 2017-11-28 |
| 9831175 | Method, apparatus, and system for E-fuse in advanced CMOS technologies | Suraj K. Patil | 2017-11-28 |
| 9824748 | SRAM bitcell structures facilitating biasing of pull-up transistors | Hui Zang, Manfred Eller | 2017-11-21 |
| 9818689 | Metal-insulator-metal capacitor and methods of fabrication | Hui Zang | 2017-11-14 |
| 9812393 | Programmable via devices with metal/semiconductor via links and fabrication methods thereof | Ajey Poovannummoottil Jacob, Suraj K. Patil | 2017-11-07 |
| 9805982 | Apparatus and method of adjusting work-function metal thickness to provide variable threshold voltages in finFETs | Hui Zang, Jinping Liu | 2017-10-31 |
| 9799661 | SRAM bitcell structures facilitating biasing of pull-down transistors | Hui Zang, Manfred Eller | 2017-10-24 |
| 9799514 | Protecting, oxidizing, and etching of material lines for use in increasing or decreasing critical dimensions of hard mask lines | Hui Zang | 2017-10-24 |
| 9768325 | Diodes and fabrication methods thereof | — | 2017-09-19 |
| 9761691 | Integrated circuits including replacement gate structures and methods for fabricating the same | Dong-Woon Shin, Xusheng Wu | 2017-09-12 |
| 9754903 | Semiconductor structure with anti-efuse device | Suraj K. Patil, Ajey Poovannummoottil Jacob | 2017-09-05 |
| 9741615 | Contacts for a fin-type field-effect transistor | Hui Zang | 2017-08-22 |
| 9735057 | Fabricating field effect transistor(s) with stressed channel region(s) and low-resistance source/drain regions | Shashidhar Shreeshail Shintri | 2017-08-15 |
| 9734897 | SRAM bitcell structures facilitating biasing of pass gate transistors | Hui Zang, Manfred Eller | 2017-08-15 |
| 9716138 | Devices and methods for dynamically tunable biasing to backplates and wells | Hui Zang | 2017-07-25 |
| 9711619 | Stress memorization and defect suppression techniques for NMOS transistor devices | Wen-Pin Peng | 2017-07-18 |
| 9704759 | Methods of forming CMOS based integrated circuit products using disposable spacers | Wen-Pin Peng, Garo Derderian | 2017-07-11 |
| 9698269 | Conformal nitridation of one or more fin-type transistor layers | Wei Tong, Tien Ying Luo, Yan Ping SHEN, Feng Zhou, Jun Lian +4 more | 2017-07-04 |
| 9698241 | Integrated circuits with replacement metal gates and methods for fabricating the same | Suraj K. Patil, Mitsuhiro Togo | 2017-07-04 |
| 9691497 | Programmable devices with current-facilitated migration and fabrication methods | Suraj K. Patil, Ajey Poovannummoottil Jacob | 2017-06-27 |
| 9673757 | Modified tunneling field effect transistors and fabrication methods | Yanxiang Liu | 2017-06-06 |
| 9659862 | Method, apparatus, and system for e-fuse in advanced CMOS technologies | Suraj K. Patil | 2017-05-23 |
| 9653583 | Methods of forming diffusion breaks on integrated circuit products comprised of finFET devices | Wei Zhao, Haiting Wang, Hongliang Shen, Zhenyu Hu | 2017-05-16 |