| 9817940 |
Method wherein test cells and dummy cells are included into a layout of an integrated circuit |
Guido Ueberreiter, Paul Ackmann, Jui-Hsuan Feng, Chin Teong Lim |
2017-11-14 |
| 9791772 |
Monitoring pattern for devices |
Paul Ackmann, Byoung Il Choi |
2017-10-17 |
| 9672312 |
Method wherein test cells and dummy cells are included into a layout of an integrated circuit |
Guido Ueberreiter, Paul Ackmann, Jui-Hsuan Feng, Chin Teong Lim |
2017-06-06 |
| 9672313 |
Method for selective re-routing of selected areas in a target layer and in adjacent interconnecting layers of an IC device |
Yuping Ren, Chin Teong Lim, Xusheng Wu, Paul Ackmann |
2017-06-06 |
| 9658531 |
Semiconductor device resolution enhancement by etching multiple sides of a mask |
Chunyu WONG, Paul Ackmann, Sarasvathi Thangaraju |
2017-05-23 |
| 9645486 |
Multiple threshold convergent OPC model |
Chin Teong Lim, Paul Ackmann |
2017-05-09 |
| 9606432 |
Alternating space decomposition in circuit structure fabrication |
Xintuo Dai, Huang Liu, Chin Teong Lim |
2017-03-28 |
| 9535319 |
Reticle, system comprising a plurality of reticles and method for the formation thereof |
Guido Ueberreiter, Jui-Hsuan Feng, Paul Ackmann, Chin Teong Lim |
2017-01-03 |
