Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9518934 | Wafer defect discovery | Hong Chen, Martin Plihal, Vidur Pandita, Ravikumar Sanapala, Vivek Bhagat +4 more | 2016-12-13 |
| 9360863 | Data perturbation for wafer inspection or metrology setup using a model of a difference | Govind Thattaisundaram, Mohan Mahadevan, Ajay Gupta, Chien-Huei Chen, Ashok Kulkarni +2 more | 2016-06-07 |
| 9310316 | Selecting parameters for defect detection methods | Chris W. Lee, Michael J. Van Riet, Yi-Chang Liu | 2016-04-12 |