CH

Chao-Kun Hu

IBM: 1 patents #5,048 of 10,295Top 50%
📍 Somers, NY: #31 of 58 inventorsTop 55%
🗺 New York: #4,336 of 11,723 inventorsTop 40%
Overall (2016): #441,470 of 481,213Top 95%
1
Patents 2016

Issued Patents 2016

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9472477 Electromigration test structure for Cu barrier integrity and blech effect evaluations Griselda Bonilla, Elbert E. Huang, Baozhen Li, Paul S. McLaughlin 2016-10-18