| 9508527 |
Sample base, charged particle beam device and sample observation method |
Takashi Ohshima, Sukehiro Ito |
2016-11-29 |
| 9472375 |
Charged particle beam device, sample stage unit, and sample observation method |
Mami Konomi, Shinsuke Kawanishi, Hiroyuki Suzuki |
2016-10-18 |
| 9466460 |
Charged particle-beam device and specimen observation method |
Taku Sakazume, Sukehiro Ito |
2016-10-11 |
| 9466457 |
Observation apparatus and optical axis adjustment method |
Mami Konomi, Shinsuke Kawanishi, Sukehiro Ito |
2016-10-11 |
| 9418818 |
Charged particle beam device and sample observation method |
Sukehiro Ito |
2016-08-16 |
| 9373480 |
Charged particle beam device and filter member |
Shinsuke Kawanishi, Masahiko Ajima, Hiroyuki Suzuki |
2016-06-21 |
| 9362083 |
Charged particle beam apparatus and sample observation method |
Shinsuke Kawanishi, Hiroyuki Suzuki, Kohtaro Hosoya, Masanari Furiki |
2016-06-07 |
| 9263232 |
Charged particle beam device |
Shinsuke Kawanishi, Tomohisa Ohtaki, Masahiko Ajima, Sukehiro Ito |
2016-02-16 |
| D748706 |
Thin membrane holder for an electron microscope |
Shinsuke Kawanishi |
2016-02-02 |
| 9251996 |
Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jig |
Shinsuke Kawanishi, Masahiko Ajima, Hiroyuki Suzuki |
2016-02-02 |
| 9240305 |
Charged particle beam device and sample observation method |
Hiroyuki Suzuki, Shinsuke Kawanishi, Masahiko Ajima |
2016-01-19 |
| 9236217 |
Inspection or observation apparatus and sample inspection or observation method |
Mami Konomi, Sukehiro Ito, Tomohisa Ohtaki, Shinsuke Kawanishi |
2016-01-12 |