Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9263232 | Charged particle beam device | Yusuke Ominami, Shinsuke Kawanishi, Masahiko Ajima, Sukehiro Ito | 2016-02-16 |
| 9236217 | Inspection or observation apparatus and sample inspection or observation method | Yusuke Ominami, Mami Konomi, Sukehiro Ito, Shinsuke Kawanishi | 2016-01-12 |