| D774045 |
Display screen with graphical user interface |
Yayoi Konishi, Naoko Ushio, Masako Nishimura, Shunya Watanabe |
2016-12-13 |
| 9472375 |
Charged particle beam device, sample stage unit, and sample observation method |
Yusuke Ominami, Shinsuke Kawanishi, Hiroyuki Suzuki |
2016-10-18 |
| 9466457 |
Observation apparatus and optical axis adjustment method |
Yusuke Ominami, Shinsuke Kawanishi, Sukehiro Ito |
2016-10-11 |
| 9443694 |
Charged particle beam apparatus, specimen observation system and operation program |
Yayoi Konishi, Mitsugu Sato, Masaki Takano, Shotaro Tamayama, Masako Nishimura +1 more |
2016-09-13 |
| 9355817 |
Ion milling device and ion milling processing method |
Shunya Watanabe, Hisayuki Takasu, Atsushi Kamino |
2016-05-31 |
| 9236217 |
Inspection or observation apparatus and sample inspection or observation method |
Yusuke Ominami, Sukehiro Ito, Tomohisa Ohtaki, Shinsuke Kawanishi |
2016-01-12 |