Issued Patents 2016
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9472375 | Charged particle beam device, sample stage unit, and sample observation method | Yusuke Ominami, Mami Konomi, Hiroyuki Suzuki | 2016-10-18 |
| 9466457 | Observation apparatus and optical axis adjustment method | Yusuke Ominami, Mami Konomi, Sukehiro Ito | 2016-10-11 |
| 9373480 | Charged particle beam device and filter member | Yusuke Ominami, Masahiko Ajima, Hiroyuki Suzuki | 2016-06-21 |
| 9362083 | Charged particle beam apparatus and sample observation method | Yusuke Ominami, Hiroyuki Suzuki, Kohtaro Hosoya, Masanari Furiki | 2016-06-07 |
| 9263232 | Charged particle beam device | Yusuke Ominami, Tomohisa Ohtaki, Masahiko Ajima, Sukehiro Ito | 2016-02-16 |
| D748706 | Thin membrane holder for an electron microscope | Yusuke Ominami | 2016-02-02 |
| 9251996 | Charged particle beam device, position adjusting method for diaphragm, and diaphragm position adjusting jig | Yusuke Ominami, Masahiko Ajima, Hiroyuki Suzuki | 2016-02-02 |
| 9240305 | Charged particle beam device and sample observation method | Yusuke Ominami, Hiroyuki Suzuki, Masahiko Ajima | 2016-01-19 |
| 9236217 | Inspection or observation apparatus and sample inspection or observation method | Yusuke Ominami, Mami Konomi, Sukehiro Ito, Tomohisa Ohtaki | 2016-01-12 |