Issued Patents 2016
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9443695 | Charged-particle beam device | Yasunari Sohda, Noritsugu Takahashi, Hajime Kawano, Osamu Komuro | 2016-09-13 |
| 9305744 | Measuring method, data processing apparatus and electron microscope using same | Junichi Tanaka, Tomoko Sekiguchi, Hiroki Kawada | 2016-04-05 |
| 9287084 | Aberration corrector and charged particle beam apparatus using the same | Zhaohui Cheng, Hideo Kashima, Hiroaki Baba, Tomonori Nakano, Kotoko Urano +1 more | 2016-03-15 |
| 9230775 | Charged particle instrument | Yasunari Sohda, Makoto Ezumi, Muneyuki Fukuda, Noritsugu Takahashi | 2016-01-05 |