Issued Patents 2016
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9423388 | Particle analyzing device | Koichi Terada, Masakazu Sugaya, Hisashi Nagano, Yasuaki Takada, Hiromi Satou | 2016-08-23 |
| 9417163 | Analyzer for substance | Hisashi Nagano, Yasuaki Takada, Yuichiro Hashimoto, Masakazu Sugaya, Koichi Terada +1 more | 2016-08-16 |
| 9287084 | Aberration corrector and charged particle beam apparatus using the same | Zhaohui Cheng, Hiroaki Baba, Takeyoshi Ohashi, Tomonori Nakano, Kotoko Urano +1 more | 2016-03-15 |
| 9261437 | Attached matter inspection device | Masakazu Sugaya, Koichi Terada, Yasutaka Suzuki, Hisashi Nagano, Yasuaki Takada +1 more | 2016-02-16 |