Issued Patents 2016
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9305744 | Measuring method, data processing apparatus and electron microscope using same | Takeyoshi Ohashi, Junichi Tanaka, Tomoko Sekiguchi | 2016-04-05 |
| 9297649 | Pattern dimension measurement method and charged particle beam apparatus | Norio Hasegawa, Toru Ikegami | 2016-03-29 |