Issued Patents 2016
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9335277 | Region-of-interest determination apparatus, observation tool or inspection tool, region-of-interest determination method, and observation method or inspection method using region-of-interest determination method | Ryo Nakagaki, Takehiro Hirai | 2016-05-10 |
| 9312099 | Charged particle beam device and method for analyzing defect therein | Satoshi Umehara, Naomasa Suzuki | 2016-04-12 |
| 9287082 | Charged particle beam apparatus | Kenichi Morita, Sayaka Tanimoto, Makoto Sakakibara, Muneyuki Fukuda, Naomasa Suzuki | 2016-03-15 |
| 9280814 | Charged particle beam apparatus that performs image classification assistance | Takehiro Hirai, Kozo Miyake | 2016-03-08 |