Issued Patents 2016
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9312099 | Charged particle beam device and method for analyzing defect therein | Kenji Obara, Naomasa Suzuki | 2016-04-12 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9312099 | Charged particle beam device and method for analyzing defect therein | Kenji Obara, Naomasa Suzuki | 2016-04-12 |