Issued Patents 2016
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9354049 | Shape measurement method, and system therefor | Chie Shishido, Maki Tanaka, Atsushi Miyamoto, Manabu Yano | 2016-05-31 |
| 9329136 | Defect inspection device and defect inspection method | Toshifumi Honda, Yuta Urano, Takahiro Jingu | 2016-05-03 |
| 9228960 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Yuta Urano | 2016-01-05 |