Issued Patents 2016
Showing 1–11 of 11 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9523648 | Defect inspection device and defect inspection method | Toshifumi Honda, Yukihiro Shibata | 2016-12-20 |
| 9506876 | X-ray inspection device, inspection method, and X-ray detector | Toshifumi Honda, Yasuko Aoki | 2016-11-29 |
| 9506872 | Inspection apparatus | Yoshimasa Oshima, Toshiyuki Nakao | 2016-11-29 |
| 9488596 | Defect inspection method and device for same | Toshifumi Honda, Hisashi Hatano | 2016-11-08 |
| 9470640 | Defect inspection method and defect inspection device | Shunichi Matsumoto, Atsushi Taniguchi, Toshifumi Honda, Yukihiro Shibata | 2016-10-18 |
| 9329137 | Defect inspection method and device using same | Yukihiro Shibata, Hideki Fukushima, Toshifumi Honda | 2016-05-03 |
| 9329136 | Defect inspection device and defect inspection method | Toshifumi Honda, Takahiro Jingu, Akira Hamamatsu | 2016-05-03 |
| 9310318 | Defect inspection method and defect inspection device | Toshifumi Honda, Yukihiro Shibata | 2016-04-12 |
| 9291574 | Defect inspection method and defect inspection device | Shunichi Matsumoto, Atsushi Taniguchi, Toshifumi Honda, Yukihiro Shibata | 2016-03-22 |
| 9255888 | Defect inspection method and device for same | Toshifumi Honda, Hisashi Hatano | 2016-02-09 |
| 9228960 | Defect inspecting method and defect inspecting apparatus | Toshiyuki Nakao, Shigenobu Maruyama, Akira Hamamatsu | 2016-01-05 |