SM

Shigenobu Maruyama

HH Hitachi High-Technologies: 1 patents #175 of 444Top 40%
📍 Oiso, JP: #3 of 4 inventorsTop 75%
Overall (2016): #229,529 of 481,213Top 50%
1
Patents 2016

Issued Patents 2016

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9228960 Defect inspecting method and defect inspecting apparatus Toshiyuki Nakao, Akira Hamamatsu, Yuta Urano 2016-01-05