Issued Patents 2016
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9488815 | Pattern evaluation method and pattern evaluation device | Atsushi Miyamoto, Mayuka Osaki, Maki Kimura | 2016-11-08 |
| 9354049 | Shape measurement method, and system therefor | Maki Tanaka, Atsushi Miyamoto, Akira Hamamatsu, Manabu Yano | 2016-05-31 |