TK

Thomas Kemen

CG Carl Zeiss Microscopy Gmbh: 5 patents #2 of 128Top 2%
Applied Materials: 4 patents #83 of 946Top 9%
Overall (2016): #22,945 of 481,213Top 5%
5
Patents 2016

Issued Patents 2016

Showing 1–5 of 5 patents

Patent #TitleCo-InventorsDate
9530613 Focusing a charged particle system Steven R. Rogers, Rainer Knippelmeyer, Stefan Schubert, Nissim Elmaliah 2016-12-27
9384938 Particle-optical systems and arrangements and particle-optical components for such systems and arrangements Dirk Zeidler, Pascal Anger, Antonio Casares, Christof Riedesel 2016-07-05
9349571 Particle optical system Pascal Anger, Dirk Zeidler, Gerd Benner 2016-05-24
9324537 Charged particle inspection method and charged particle system Rainer Knippelmeyer, Stefan Schubert 2016-04-26
9263233 Charged particle multi-beam inspection system and method of operating the same Dirk Zeidler, Rainer Knippelmeyer, Mario Muetzel, Stefan Schubert, Nissim Elmaliah +1 more 2016-02-16