MM

Mario Muetzel

Applied Materials: 1 patents #401 of 946Top 45%
CG Carl Zeiss Microscopy Gmbh: 1 patents #38 of 128Top 30%
📍 Oberkochen, DE: #24 of 55 inventorsTop 45%
Overall (2016): #302,389 of 481,213Top 65%
1
Patents 2016

Issued Patents 2016

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9263233 Charged particle multi-beam inspection system and method of operating the same Dirk Zeidler, Rainer Knippelmeyer, Thomas Kemen, Stefan Schubert, Nissim Elmaliah +1 more 2016-02-16